Last update: Sun Oct 15 02:05:00 MDT 2017
@Article{Goyal:2006:ITP, author = "Suresh Goyal and James H. {Mosher Jr.}", title = "An improved test process model for cost reduction", journal = j-BELL-LABS-TECH-J, volume = "11", number = "1", pages = "173--190", month = "Spring", year = "2006", CODEN = "BLTJFD", DOI = "https://doi.org/10.1002/bltj.20151", ISSN = "1089-7089 (print), 1538-7305 (electronic)", ISSN-L = "1089-7089", bibdate = "Fri Nov 26 17:31:37 MST 2010", bibsource = "http://www.math.utah.edu/pub/tex/bib/bstj2000.bib", acknowledgement = ack-nhfb, fjournal = "Bell Labs Technical Journal", journal-URL = "http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1538-7305/issues/", onlinedate = "16 May 2006", }