Last update: Sun Oct 15 02:05:00 MDT 2017
@Article{Yue:2006:ARO, author = "Chen Wen Yue and Yu Jie and Jiang Wen Yuan", title = "Achieving reliability in {OEM\slash ODM CPE} products", journal = j-BELL-LABS-TECH-J, volume = "11", number = "1", pages = "209--213", month = "Spring", year = "2006", CODEN = "BLTJFD", DOI = "https://doi.org/10.1002/bltj.20155", ISSN = "1089-7089 (print), 1538-7305 (electronic)", ISSN-L = "1089-7089", bibdate = "Fri Nov 26 17:31:37 MST 2010", bibsource = "http://www.math.utah.edu/pub/tex/bib/bstj2000.bib", acknowledgement = ack-nhfb, fjournal = "Bell Labs Technical Journal", journal-URL = "http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1538-7305/issues/", onlinedate = "16 May 2006", }