Last update: Sun Oct 15 02:37:12 MDT 2017
@Article{Vanlaer:2012:IIO,
author = "Jef Vanlaer and Pieter {Van den Kerkhof} and Geert
Gins and Jan F. M. {Van Impe}",
title = "The Influence of Input and Output Measurement Noise on
Batch-End Quality Prediction with Partial Least
Squares",
journal = j-LECT-NOTES-COMP-SCI,
volume = "7377",
pages = "121--135",
year = "2012",
CODEN = "LNCSD9",
DOI = "https://doi.org/10.1007/978-3-642-31488-9_11",
ISSN = "0302-9743 (print), 1611-3349 (electronic)",
ISSN-L = "0302-9743",
bibdate = "Wed Dec 19 15:21:15 MST 2012",
bibsource = "http://www.math.utah.edu/pub/tex/bib/lncs2012f.bib",
URL = "http://link.springer.com/chapter/10.1007/978-3-642-31488-9_11/",
acknowledgement = ack-nhfb,
book-DOI = "https://doi.org/10.1007/978-3-642-31488-9",
book-URL = "http://www.springerlink.com/content/978-3-642-31488-9",
fjournal = "Lecture Notes in Computer Science",
}