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BibTeX entry
@Article{Qureishi:1965:SIP,
author = "A. S. Qureishi and K. J. Nabavian and J. D. Alanen",
title = "Sampling Inspection Plans for Discriminating between
Two {Weibull} Processes",
journal = j-TECHNOMETRICS,
volume = "7",
number = "4",
pages = "589--601",
month = nov,
year = "1965",
CODEN = "TCMTA2",
DOI = "https://doi.org/10.2307/1266398",
ISSN = "0040-1706 (print), 1537-2723 (electronic)",
ISSN-L = "0040-1706",
bibdate = "Sat Jun 21 13:17:48 MDT 2014",
bibsource = "http://www.jstor.org/journals/00401706.html;
http://www.jstor.org/stable/i254244;
http://www.math.utah.edu/pub/tex/bib/technometrics1960.bib",
URL = "http://www.jstor.org/stable/1266398",
acknowledgement = ack-nhfb,
fjournal = "Technometrics",
journal-URL = "http://www.jstor.org/journals/00401706.html",
}
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