Last update: Fri Feb 9 02:05:42 MST 2018
@Article{Booth:1994:BRBb, author = "David E. Booth", title = "Book Review: {{\booktitle{Statistical Methods for SPC and TQM}} by Derek Bissell}", journal = j-TECHNOMETRICS, volume = "36", number = "4", pages = "420--421", month = nov, year = "1994", CODEN = "TCMTA2", DOI = "https://doi.org/10.2307/1269959", ISSN = "0040-1706 (print), 1537-2723 (electronic)", ISSN-L = "0040-1706", bibdate = "Sat Jun 21 13:20:04 MDT 2014", bibsource = "http://www.jstor.org/journals/00401706.html; http://www.jstor.org/stable/i254359; http://www.math.utah.edu/pub/tex/bib/technometrics1990.bib", URL = "http://www.jstor.org/stable/1269959", acknowledgement = ack-nhfb, fjournal = "Technometrics", journal-URL = "http://www.jstor.org/journals/00401706.html", }