Last update: Sun Oct 15 02:37:12 MDT 2017
@Article{Vanlaer:2012:IIO, author = "Jef Vanlaer and Pieter {Van den Kerkhof} and Geert Gins and Jan F. M. {Van Impe}", title = "The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares", journal = j-LECT-NOTES-COMP-SCI, volume = "7377", pages = "121--135", year = "2012", CODEN = "LNCSD9", DOI = "https://doi.org/10.1007/978-3-642-31488-9_11", ISSN = "0302-9743 (print), 1611-3349 (electronic)", ISSN-L = "0302-9743", bibdate = "Wed Dec 19 15:21:15 MST 2012", bibsource = "http://www.math.utah.edu/pub/tex/bib/lncs2012f.bib", URL = "http://link.springer.com/chapter/10.1007/978-3-642-31488-9_11/", acknowledgement = ack-nhfb, book-DOI = "https://doi.org/10.1007/978-3-642-31488-9", book-URL = "http://www.springerlink.com/content/978-3-642-31488-9", fjournal = "Lecture Notes in Computer Science", }