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BibTeX entry
@Article{Wey:1987:NST,
author = "C.-L. Wey and F. Lombardi",
title = "On a Novel Self-test Approach to Digital Testing",
journal = j-COMP-J,
volume = "30",
number = "3",
pages = "258--267",
month = jun,
year = "1987",
CODEN = "CMPJA6",
DOI = "https://doi.org/10.1093/comjnl/30.3.258",
ISSN = "0010-4620 (print), 1460-2067 (electronic)",
ISSN-L = "0010-4620",
bibdate = "Tue Dec 4 14:48:23 MST 2012",
bibsource = "Compendex database;
http://comjnl.oxfordjournals.org/content/30/3.toc;
http://www.math.utah.edu/pub/tex/bib/compj1980.bib;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/",
URL = "http://comjnl.oxfordjournals.org/content/30/3/258.full.pdf+html;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/258.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/259.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/260.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/261.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/262.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/263.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/264.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/265.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/266.tif;
http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/267.tif",
acknowledgement = ack-nhfb,
affiliation = "Michigan State Univ, East Lansing, MI, USA",
affiliationaddress = "Michigan State Univ, East Lansing, MI, USA",
classcodes = "C5210B (Computer-aided logic design); C7410D
(Electronic engineering)",
classification = "721; 723; 921; 922",
corpsource = "Dept. of Electr. Eng., Michigan State Univ., East
Lansing, MI, USA",
fjournal = "The Computer Journal",
journal-URL = "http://comjnl.oxfordjournals.org/",
keywords = "automatic testing; Boolean; circuit analysis
computing; complexity; component equations; computer
programming --- Algorithms; covering set theory;
decision theory and analysis; difference connection;
digital testing; discrete component connection model;
dynamical modelling; large-scale dynamic model; logic
CAD; logic circuits, combinatorial; logic circuits,
sequential --- Testing; logic testing; mathematical
models; self-test; self-test approach; simulation
packages; technique; Testing",
treatment = "P Practical",
}
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