Entry Wey:1987:NST from compj1980.bib

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BibTeX entry

@Article{Wey:1987:NST,
  author =       "C.-L. Wey and F. Lombardi",
  title =        "On a Novel Self-test Approach to Digital Testing",
  journal =      j-COMP-J,
  volume =       "30",
  number =       "3",
  pages =        "258--267",
  month =        jun,
  year =         "1987",
  CODEN =        "CMPJA6",
  DOI =          "https://doi.org/10.1093/comjnl/30.3.258",
  ISSN =         "0010-4620 (print), 1460-2067 (electronic)",
  ISSN-L =       "0010-4620",
  bibdate =      "Tue Dec 4 14:48:23 MST 2012",
  bibsource =    "Compendex database;
                 http://comjnl.oxfordjournals.org/content/30/3.toc;
                 http://www.math.utah.edu/pub/tex/bib/compj1980.bib;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/",
  URL =          "http://comjnl.oxfordjournals.org/content/30/3/258.full.pdf+html;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/258.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/259.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/260.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/261.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/262.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/263.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/264.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/265.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/266.tif;
                 http://www3.oup.co.uk/computer_journal/hdb/Volume_30/Issue_03/tiff/267.tif",
  acknowledgement = ack-nhfb,
  affiliation =  "Michigan State Univ, East Lansing, MI, USA",
  affiliationaddress = "Michigan State Univ, East Lansing, MI, USA",
  classcodes =   "C5210B (Computer-aided logic design); C7410D
                 (Electronic engineering)",
  classification = "721; 723; 921; 922",
  corpsource =   "Dept. of Electr. Eng., Michigan State Univ., East
                 Lansing, MI, USA",
  fjournal =     "The Computer Journal",
  journal-URL =  "http://comjnl.oxfordjournals.org/",
  keywords =     "automatic testing; Boolean; circuit analysis
                 computing; complexity; component equations; computer
                 programming --- Algorithms; covering set theory;
                 decision theory and analysis; difference connection;
                 digital testing; discrete component connection model;
                 dynamical modelling; large-scale dynamic model; logic
                 CAD; logic circuits, combinatorial; logic circuits,
                 sequential --- Testing; logic testing; mathematical
                 models; self-test; self-test approach; simulation
                 packages; technique; Testing",
  treatment =    "P Practical",
}

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