Entry Barnard:1990:HFD from dectechj.bib

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BibTeX entry

@Article{Barnard:1990:HFD,
  author =       "K. E. Barnard and R. P. Harokopus",
  title =        "Hierarchical fault detection and isolation strategy
                 for the {VAX 9000} system",
  journal =      j-DEC-TECH-J,
  volume =       "2",
  number =       "4",
  pages =        "130--141",
  month =        "Fall",
  year =         "1990",
  CODEN =        "DTJOEL",
  ISSN =         "0898-901X",
  bibdate =      "Thu Mar 20 18:15:43 MST 1997",
  bibsource =    "http://www.math.utah.edu/pub/tex/bib/dectechj.bib",
  abstract =     "The VAX 9000 system was designed to compete in the
                 mainframe market. Mainframe customers not only require
                 high processor performance and throughput, but also a
                 system which is reliable and always available. This
                 paper demonstrates how the newly implemented scan
                 system, in conjunction with scan pattern testing and
                 symptom-directed diagnosis (SDD), is essential to
                 satisfy these needs. SDD is the use of on-line error
                 detectors and state information saved at the time of an
                 error to isolate the fault that caused the error. The
                 scan system of the VAX 9000 system allows individual
                 state elements in the processor to be set and sensed,
                 and is the basis for fault detection and isolation.",
  acknowledgement = ack-nhfb,
  affiliation =  "Digital Equipment Corp., Maynard, MA, USA",
  classcodes =   "C5420 (Mainframes and minicomputers); C5470
                 (Performance evaluation and testing)",
  classification = "C5420 (Mainframes and minicomputers); C5470
                 (Performance evaluation and testing)",
  corpsource =   "Digital Equipment Corp., Maynard, MA, USA",
  keywords =     "computers; DEC; DEC computers; fault tolerant
                 computing; Hierarchical fault detection; hierarchical
                 fault detection; high; High processor performance;
                 Isolation strategy; isolation strategy; mainframes;
                 Online error detection; online error detection;
                 processor performance; scan pattern testing; Scan
                 pattern testing; Scan system; scan system; state
                 elements; State elements; Symptom-directed diagnosis;
                 symptom-directed diagnosis; VAX 9000 system",
  thesaurus =    "DEC computers; Fault tolerant computing; Mainframes",
  treatment =    "P Practical",
}

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